| Product name | Acetone, 99.5% (Synonyms : 아세톤, Propanone) |
| Product No. | 9005-05 |
| Assay (by GC) | Min. 99.5% |
| Grade | CMOS |
| Unit | 4L |
| CAS No. | 67-64-1 |
| Lead time | 3 ~ 5days after order |
| Properties | Molecular formula : CH3COCH3 Molecular weight : 58.08 g/mol Boiling point : 56.2℃ Melting point : -95.4℃ Flash point : <-20℃ Density : 0.792 g/cm3 at 20℃ Storage temperature : Ambient |
사양 테스트 결과
| For Microelectronic Use | |
| Assay ((CH₃)₂CO) (by GC, Corrected for Water) | ≥99.5% |
| Colour (APHA) | ≤10 |
| Residue after Evaporation | ≤5 ppm |
| Titrable Acid (µeq/g) | ≤0.3 |
| Titrable Base (µeq/g) | ≤0.5 |
| Water (H₂O) | ≤0.5% |
| Solubility in H₂O | Passes Test |
| Chloride (Cl) | ≤0.2 ppm |
| Phosphate (PO₄) | ≤0.05 ppm |
| Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
| Arsenic and Antimony (as As) | ≤5.0 ppb |
| Trace Impurities - Barium (Ba) | ≤20.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
| Trace Impurities - Boron (B) | ≤10.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤25.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
| Trace Impurities - Copper (Cu) | ≤10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
| Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
| Trace Impurities - Gold (Au) | ≤20 ppb |
| Trace Impurities - Iron (Fe) | ≤20.0 ppb |
| Trace Impurities - Lead (Pb) | ≤10.0 ppb |
| Trace Impurities - Lithium (Li) | ≤10.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤20 ppb |
| Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
| Trace Impurities - Niobium (Nb) | ≤50.0 ppb |
| Trace Impurities - Potassium (K) | ≤10.0 ppb |
| Trace Impurities - Silicon (Si) | ≤50 ppb |
| Trace Impurities - Silver (Ag) | ≤10.0 ppb |
| Trace Impurities - Sodium (Na) | ≤10.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤50.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
| Trace Impurities - Tin (Sn) | ≤20.0 ppb |
| Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
| Trace Impurities - Vanadium (V) | ≤10.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
| Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
| Particle Count - 0.5 µm and Greater (Rion KS42AF) | ≤100 par/ml |
| Particle Count - 1.0 µm and Greater (Rion KS42AF) | ≤8 par/ml |
| Product name | Acetone, 99.5% (Synonyms : 아세톤, Propanone) |
| Product No. | 9005-05 |
| Assay (by GC) | Min. 99.5% |
| Grade | CMOS |
| Unit | 4L |
| CAS No. | 67-64-1 |
| Lead time | 3 ~ 5days after order |
| Properties | Molecular formula : CH3COCH3 Molecular weight : 58.08 g/mol Boiling point : 56.2℃ Melting point : -95.4℃ Flash point : <-20℃ Density : 0.792 g/cm3 at 20℃ Storage temperature : Ambient |
사양 테스트 결과
| For Microelectronic Use | |
| Assay ((CH₃)₂CO) (by GC, Corrected for Water) | ≥99.5% |
| Colour (APHA) | ≤10 |
| Residue after Evaporation | ≤5 ppm |
| Titrable Acid (µeq/g) | ≤0.3 |
| Titrable Base (µeq/g) | ≤0.5 |
| Water (H₂O) | ≤0.5% |
| Solubility in H₂O | Passes Test |
| Chloride (Cl) | ≤0.2 ppm |
| Phosphate (PO₄) | ≤0.05 ppm |
| Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
| Arsenic and Antimony (as As) | ≤5.0 ppb |
| Trace Impurities - Barium (Ba) | ≤20.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
| Trace Impurities - Boron (B) | ≤10.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤25.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
| Trace Impurities - Copper (Cu) | ≤10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
| Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
| Trace Impurities - Gold (Au) | ≤20 ppb |
| Trace Impurities - Iron (Fe) | ≤20.0 ppb |
| Trace Impurities - Lead (Pb) | ≤10.0 ppb |
| Trace Impurities - Lithium (Li) | ≤10.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤20 ppb |
| Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
| Trace Impurities - Niobium (Nb) | ≤50.0 ppb |
| Trace Impurities - Potassium (K) | ≤10.0 ppb |
| Trace Impurities - Silicon (Si) | ≤50 ppb |
| Trace Impurities - Silver (Ag) | ≤10.0 ppb |
| Trace Impurities - Sodium (Na) | ≤10.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤50.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
| Trace Impurities - Tin (Sn) | ≤20.0 ppb |
| Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
| Trace Impurities - Vanadium (V) | ≤10.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
| Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
| Particle Count - 0.5 µm and Greater (Rion KS42AF) | ≤100 par/ml |
| Particle Count - 1.0 µm and Greater (Rion KS42AF) | ≤8 par/ml |
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